Characterization of nanowires with the low energy electron...

physica status solidi (b) 2010 Vol. 247; Iss. 10

Characterization of nanowires with the low energy electron point source (LEEPS) microscope

André Beyer, Dirk H. Weber, Berthold Völkel, Armin Gölzhäuser
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Volume:
247
Year:
2010
Language:
english
Pages:
7
DOI:
10.1002/pssb.201046260
File:
PDF, 467 KB
english, 2010
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