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Characterization of AlGaInN layers using X-ray diffraction and fluorescence
Lars Groh, Christoph Hums, Jürgen Bläsing, Alois Krost, Armin DadgarVolume:
248
Year:
2011
Language:
english
Pages:
5
DOI:
10.1002/pssb.201046418
File:
PDF, 525 KB
english, 2011