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Nickel-related defects in ZnO – A deep-level transient spectroscopy and photo-capacitance study
Matthias Schmidt, Kerstin Brachwitz, Florian Schmidt, Martin Ellguth, Holger von Wenckstern, Rainer Pickenhain, Marius Grundmann, Gerhard Brauer, Wolfgang SkorupaVolume:
248
Year:
2011
Language:
english
Pages:
7
DOI:
10.1002/pssb.201046634
File:
PDF, 265 KB
english, 2011