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[IEEE 2015 International Workshop on CMOS Variability (VARI) - Salvador, Brazil (2015.9.1-2015.9.4)] 2015 International Workshop on CMOS Variability (VARI) - Exploration of noise robustness and sensitivity of bulk current sensors for soft error detection
Mourao Melo, Joao Guilherme, Torres, Frank Sill, Possamai Bastos, RodrigoYear:
2015
Language:
english
DOI:
10.1109/vari.2015.7456556
File:
PDF, 879 KB
english, 2015