SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Machine Vision Applications, Architectures, and Systems Integration II - Automated inspection of bread and loaves
Batchelor, Bruce G., Batchelor, Bruce G., Solomon, Susan Snell, Waltz, Frederick M.Volume:
2064
Year:
1993
Language:
english
DOI:
10.1117/12.150278
File:
PDF, 929 KB
english, 1993