SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Reflection, Scattering, and Diffraction from Surfaces IV - A Mach-Zehnder interferometer for the fine control of the polarization status of a beam
Hanssen, Leonard M., Tessarolo, Enrico, Corso, Alain Jody, Bonaldo, Stefano, Zuppella, Paola, Pelizzo, Maria GuglielminaVolume:
9205
Year:
2014
Language:
english
DOI:
10.1117/12.2061874
File:
PDF, 445 KB
english, 2014