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Memory Characteristics of Metal-Oxide-Semiconductor Structures Based on Ge Nanoclusters-Embedded GeOx Films Grown at Low Temperature
Lin, Tzu-Shun, Lou, Li-Ren, Lee, Ching-Ting, Tsai, Tai-ChengVolume:
12
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2012.6141
Date:
March, 2012
File:
PDF, 771 KB
english, 2012