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The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam Case
R. Gevers, R. Serneels, M. DavidVolume:
66
Year:
1974
Language:
english
Pages:
12
DOI:
10.1002/pssb.2220660209
File:
PDF, 603 KB
english, 1974