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[IEEE 2012 International Conference on Advanced Technologies for Communications (ATC 2012) - Ha Noi, Vietnam (2012.10.10-2012.10.12)] The 2012 International Conference on Advanced Technologies for Communications - Local (V,T) estimation in integrated circuits using a set of statistical tests
Lesecq, SuzanneYear:
2012
Language:
english
DOI:
10.1109/atc.2012.6404214
File:
PDF, 87 KB
english, 2012