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[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Electron trapping dominance in strained germanium quantum well planar and FinFET devices with NBTI
Agrawal, Nidhi, Agrawal, Ashish, Mukhopadhyay, Subhadeep, Mahapatra, Souvik, Datta, SumanYear:
2015
Language:
english
DOI:
10.1109/drc.2015.7175686
File:
PDF, 873 KB
english, 2015