[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Hot carrier issues in thin body double-gate MOSFET
Ming Li,, Eua-Jung Yoon,, Chang-Woo Oh,, Sung-Young Lee,, Sung-Min Kim,, Kyeong-Hwan Yeo,, Min-Sang Kim,, Sung-Hwan Kim,, Dong-Uk Choi,, Jeong-Dong Choe,, Dong-Won Kim,, Donggun Park,, KinVolume:
2
Year:
2004
Language:
english
DOI:
10.1109/icsict.2004.1436631
File:
PDF, 1.22 MB
english, 2004