[IEEE 2006 International Workshop on Junction Technology - Shanghai, China (15-16 May 2006)] 2006 International Workshop on Junction Technology - Bias Dependence of Partially-Depleted SOI Transistor to Total Dose Irradiation
Yingmin Wang,, Xiaohe Wang,, Guiru Zhao,, Yunfei En,, Hongwei Luo,, Qian Shi,, Xiaowen Zhang,Year:
2006
Language:
english
DOI:
10.1109/iwjt.2006.1669486
File:
PDF, 2.90 MB
english, 2006