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The critical voltage effect in transmission electron microscopy. IX. The Calculation of Critical Voltages and Experimental Extinction Distances in Complicated Many-Beam Systems
M. David, R. GeversVolume:
84
Year:
1977
Language:
english
Pages:
15
DOI:
10.1002/pssb.2220840115
File:
PDF, 902 KB
english, 1977