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The Critical Voltage Effect in Transmission Electron Microscopy. X. Experimental Observatisons in the Presence of Non-Systematic Reflections
M. David, G. van Tendeloo, J. van Landuyt, R. GeversVolume:
87
Year:
1978
Language:
english
Pages:
14
DOI:
10.1002/pssb.2220870202
File:
PDF, 1.83 MB
english, 1978