Experimental DC Extraction of the Base Resistance of...

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Experimental DC Extraction of the Base Resistance of Bipolar Transistors: Application to SiGe:C HBTs

d'Alessandro, Vincenzo, Sasso, Grazia, Rinaldi, Niccolo, Aufinger, Klaus
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2565203
File:
PDF, 2.66 MB
english, 2016
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