![](/img/cover-not-exists.png)
Experimental DC Extraction of the Base Resistance of Bipolar Transistors: Application to SiGe:C HBTs
d'Alessandro, Vincenzo, Sasso, Grazia, Rinaldi, Niccolo, Aufinger, KlausYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2565203
File:
PDF, 2.66 MB
english, 2016