Characterization of Effective Mobility and its Degradation...

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IEEE Transactions on Nanotechnology 2016

Characterization of Effective Mobility and its Degradation Mechanism in MoS2 MOSFETs

Mori, Takahiro, Ninomiya, Naruki, Kubo, Toshitaka, Uchida, Noriyuki, Watanabe, Eiichiro, Tsuya, Daiju, Moriyama, Satoshi, Tanaka, Masatoshi, Ando, Atsushi
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2016.2570280
File:
PDF, 1.23 MB
english, 2016
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