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[IEEE VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. - Dallas, TX, USA (28-25 Sept., 2005)] VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. - Reduced complexity sequential sequence detection using modified Fano algorithm for V-BLAST systems
Jongsub Cha,, Joonhyuk Kang,, Hoojin Lee,, Hyuckjae Lee,Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/vetecf.2005.1557461
File:
PDF, 140 KB
english, 2005