![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Scanning Probe Microscopies II - Magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry
DiCarlo, Anthony, Scheinfein, Michael R., Chamberlin, Ralph V., Williams, Clayton C.Volume:
1855
Year:
1993
Language:
english
DOI:
10.1117/12.146376
File:
PDF, 510 KB
english, 1993