![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - Real-time optically processed target recognition system based on arbitrary moire contours
Andrade, Rafael A., Gilbert, Bernard R., Cahall, Scott C., Kozaitis, Samuel P., Blatt, Joel H., Svetkoff, Donald J.Volume:
2348
Year:
1994
Language:
english
DOI:
10.1117/12.198840
File:
PDF, 945 KB
english, 1994