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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Reflection, Scattering, and Diffraction from Surfaces IV - Dynamic data driven bidirectional reflectance distribution function measurement system
Hanssen, Leonard M., Nauyoks, Stephen E., Freda, Sam, Marciniak, Michael A.Volume:
9205
Year:
2014
Language:
english
DOI:
10.1117/12.2061485
File:
PDF, 395 KB
english, 2014