![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Long-range active retroreflector to measure the rotational orientation in conjunction with a laser tracker
Han, Sen, Yoshizawa, Toru, Zhang, Song, Hofherr, O., Wachten, C., Müller, C., Reinecke, H.Volume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071945
File:
PDF, 1.13 MB
english, 2014