SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Diffraction optical elements with deep phase profile obtained with the use of x-ray parallel intensive beam
Koronkevich, Voldemar P., Kulipanov, G. N., Makarov, Oleg A., Nazmov, Vladimir, Pindyurin, Valery F., Sinyukov, M. P., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226228
File:
PDF, 125 KB
english, 1995