SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] GOES-8 and Beyond - Solar x-ray imager (SXI) detector calibration and characterization
Russell, Kenneth J., Briscoe, Jeri M., Corder, Eric L., Wallace, S., Chappell, John H., Washwell, Edward R.Volume:
2812
Year:
1996
Language:
english
DOI:
10.1117/12.254109
File:
PDF, 730 KB
english, 1996