SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Wavelet Applications V - Image quality metrics based on scale
Namuduri, Kameswara R., Murenzi, Romain, Kaplan, Lance M., Johnson, Davida, Szu, Harold H.Volume:
3391
Year:
1998
Language:
english
DOI:
10.1117/12.304874
File:
PDF, 1.39 MB
english, 1998