![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Applications of Digital Image Processing XXI - Optical/structural machine analysis of a material's microstructure as a basis for formation of constructional strength of details
Ulianov, Eduard I., Liasnikov, A. V., Lavrov, Alexey A., Svetlichny, D. P., Ulianov, A. V., Tescher, Andrew G.Volume:
3460
Year:
1998
Language:
english
DOI:
10.1117/12.323228
File:
PDF, 122 KB
english, 1998