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SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Device Technology II - Impact of silicon-type floating gate on EEPROM performance
Ogier-Monnier, Karine, Boivin, Philippe, Bonnaud, Olivier, Burnett, David, Wristers, Dirk, Tsuchiya, ToshiakiVolume:
3506
Year:
1998
Language:
english
DOI:
10.1117/12.323973
File:
PDF, 1010 KB
english, 1998