SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Microfocusing: Applications and Techniques - Applications and instrumentation advances with the Stony Brook scanning transmission x-ray microscope
Feser, Michael, Carlucci-Dayton, Mary, Jacobsen, Chris J., Kirz, Janos, Neuhaeusler, Ulrich, Smith, Graham, Yu, Bo, McNulty, IanVolume:
3449
Year:
1998
Language:
english
DOI:
10.1117/12.330348
File:
PDF, 2.20 MB
english, 1998