SPIE Proceedings [SPIE Optical Engineering for Sensing and...

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SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Yokohama, Japan (Wednesday 16 June 1999)] Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Amplitude measurement of a sinusoidally oscillating object using a frequency-ramped laser diode with some intensity modulation indices

Imai, Masaaki M., Kondoh, Masashi, Murakami, Naohiro, Yamaguchi, Ichirou
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Volume:
3740
Year:
1999
Language:
english
DOI:
10.1117/12.347746
File:
PDF, 236 KB
english, 1999
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