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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Imaging Spectrometry V - Quantifying multivariate classification performance: the problem of overfitting
Stallard, Brian R., Taylor, John G., Descour, Michael R., Shen, Sylvia S.Volume:
3753
Year:
1999
Language:
english
DOI:
10.1117/12.366304
File:
PDF, 465 KB
english, 1999