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SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Monday 18 September 2000)] Microfluidic Devices and Systems III - Flow-rate measurement via conductivity monitoring in microfluidic devices
Rainey, Paul V., Mitchell, S. J. N., Gamble, Harold S., Mastrangelo, Carlos H., Becker, HolgerVolume:
4177
Year:
2000
Language:
english
DOI:
10.1117/12.395659
File:
PDF, 298 KB
english, 2000