SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Diagnostic Methods for Inorganic Materials II - Infrared refractive index measurements using a new method
Yang, Di, Thomas, Michael E., Tropf, William J., Kaplan, Simon G., Hanssen, Leonard M.Volume:
4103
Year:
2000
Language:
english
DOI:
10.1117/12.403589
File:
PDF, 319 KB
english, 2000