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SPIE Proceedings [SPIE Smart Materials and MEMS - Melbourne, Australia (Wednesday 13 December 2000)] Smart Materials - Materials surface topography and composition imaging using dynamic atomic force microscopy
Snitka, Valentinas J., Mizariene, Vida, Ulcinas, Arturas, Wilson, Alan R., Asanuma, HiroshiVolume:
4234
Year:
2001
Language:
english
DOI:
10.1117/12.424416
File:
PDF, 416 KB
english, 2001