SPIE Proceedings [SPIE Smart Materials and MEMS -...

  • Main
  • SPIE Proceedings [SPIE Smart Materials...

SPIE Proceedings [SPIE Smart Materials and MEMS - Melbourne, Australia (Wednesday 13 December 2000)] Smart Materials - Materials surface topography and composition imaging using dynamic atomic force microscopy

Snitka, Valentinas J., Mizariene, Vida, Ulcinas, Arturas, Wilson, Alan R., Asanuma, Hiroshi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4234
Year:
2001
Language:
english
DOI:
10.1117/12.424416
File:
PDF, 416 KB
english, 2001
Conversion to is in progress
Conversion to is failed