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SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II - Defects correction for digital dental x-ray sensors
Kim, Jong D., Kim, Seo-Gyoo, Kim, Jongwon, Blouke, Morley M., Canosa, John, Sampat, NitinVolume:
4306
Year:
2001
Language:
english
DOI:
10.1117/12.426965
File:
PDF, 2.16 MB
english, 2001