SPIE Proceedings [SPIE Optical Engineering for Sensing and...

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SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '01) - Yokohama, Japan (Wednesday 6 June 2001)] Optical Engineering for Sensing and Nanotechnology (ICOSN 2001) - Temperature measurement decreasing measurement error caused by stray lights and unpredictable emissivity

Ino, Tomomi, Yamada, Wataru, Suzuki, Hiromi, Tsumura, Akira, Akama, Yoshiaki, Nishida, Naoto, Iwata, Koichi
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Volume:
4416
Year:
2001
Language:
english
DOI:
10.1117/12.427051
File:
PDF, 134 KB
english, 2001
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