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SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Optomechatronic Systems II - Statistical-learning-based object recognition algorithm for solder joint inspection
Koh, Kyoungchul, Choi, H.J., Kim, Jae-Seon, Cho, Hyungsuck, Cho, HyungsuckVolume:
4564
Year:
2001
Language:
english
DOI:
10.1117/12.444096
File:
PDF, 393 KB
english, 2001