![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Machine Vision Applications in Industrial Inspection XI - Relief reconstruction of rough-textured surface through image analysis
Benslimane, Anis, Khoudeir, Majdi, Brochard, Jacques, Legeay, Vincent, Do, Min-Tan, Hunt, Martin A., Price, Jeffery R.Volume:
5011
Year:
2003
Language:
english
DOI:
10.1117/12.474044
File:
PDF, 429 KB
english, 2003