SPIE Proceedings [SPIE Fundamental Problems of...

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SPIE Proceedings [SPIE Fundamental Problems of Optoelectronics and Microelectronics - Vladivostok, Russian Federation (Monday 30 September 2002)] Fundamental Problems of Optoelectronics and Microelectronics - Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes

Kulchin, Yury N., Vasiliev, Vladimir P., Nikonov, Yuri Y., Kulchin, Yuri N., Vitrik, Oleg B.
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Volume:
5129
Year:
2003
Language:
english
DOI:
10.1117/12.502158
File:
PDF, 179 KB
english, 2003
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