SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optical Manufacturing and Testing VI - New methods for calibrating systematic errors in interferometric measurements
O'Donohue, S., Stahl, H. Philip, Devries, G., Murphy, P., Forbes, G., Dumas, P.Volume:
5869
Year:
2005
Language:
english
DOI:
10.1117/12.617699
File:
PDF, 579 KB
english, 2005