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SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Wavelet Applications in Industrial Processing III - Analysis of multiband astronomical images using multiscale tools
Bijaoui, Albert, Truchetet, Frederic, Laligant, Olivier, Guennec, Anaïs, Benoist, Christophe, Slezak, EricVolume:
6001
Year:
2005
Language:
english
DOI:
10.1117/12.629697
File:
PDF, 618 KB
english, 2005