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SPIE Proceedings [SPIE Optomechatronic Technologies 2005 - Sapporo, Japan (Monday 5 December 2005)] Optomechatronic Sensors and Instrumentation - Effect of weight in averaging of phases on accuracy in windowed digital holographic interferometry for pico-meter displacement measurement (Invited Paper)
Morimoto, Yoshiharu, Matui, Toru, Fujigaki, Motoharu, Kawagishi, Norikazu, Takaya, YasuhiroVolume:
6049
Year:
2005
Language:
english
DOI:
10.1117/12.648696
File:
PDF, 560 KB
english, 2005