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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Image processing for pattern diffracted by phase plate
Hou, Xun, Tang, Shuiyuan, Li, Zhi, Yuan, Jiahu, Wyant, James C., Hao, Qun, Wang, Hexin, Han, SenVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.676516
File:
PDF, 273 KB
english, 2005