SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - Fresnel wavefront propagation model for shearography shape measurement
Anand, Arun, Groves, Roger M., Schwab, Xavier, Pedrini, Giancarlo, Osten, Wolfgang, Bosse, Harald, Bodermann, Bernd, Silver, Richard M.Volume:
6617
Year:
2007
Language:
english
DOI:
10.1117/12.725985
File:
PDF, 714 KB
english, 2007