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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Real-time multicamera system for measurement of 3D coordinates by pattern projection
Sainov, Ventseslav, Stoykova, Elena, Harizanova, Jana, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.726380
File:
PDF, 1.54 MB
english, 2007