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SPIE Proceedings [SPIE Optics East 2007 - Boston, MA (Sunday 9 September 2007)] Two- and Three-Dimensional Methods for Inspection and Metrology V - Mobile shearography in applications
Kalms, Michael, Huang, Peisen S.Volume:
6762
Year:
2007
Language:
english
DOI:
10.1117/12.735483
File:
PDF, 2.12 MB
english, 2007