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SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Visualization and Data Analysis 2008 - Extending the dimensionality of flatland with attribute view probabilistic models
Börner, Katy, Neufeld, Eric, Bickis, Mikelis, Gröhn, Matti T., Park, Jinah, Grant, Kevin, Roberts, Jonathan C.Volume:
6809
Year:
2008
Language:
english
DOI:
10.1117/12.767279
File:
PDF, 455 KB
english, 2008