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SPIE Proceedings [SPIE The 15th International Symposium on: Smart Structures and Materials & Nondestructive Evaluation and Health Monitoring - San Diego, California (Sunday 9 March 2008)] Modeling, Signal Processing, and Control for Smart Structures 2008 - Binary tree SVM based framework for mining fatigue induced damage attributes in complex lug joints
Coelho, Clyde K., Lindner, Douglas K., Das, Santanu, Chattopadhyay, AditiVolume:
6926
Year:
2008
Language:
english
DOI:
10.1117/12.776481
File:
PDF, 520 KB
english, 2008