SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Correlation function of angle-of-arrival measurements with one-dimensional Shack-Hartmann wavefront sensor
Huang, Shengyang, Pan, Junhua, Wyant, James C., Li, Wenyu, Zhou, Pu, Wang, Hexin, Geng, YifengVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.783190
File:
PDF, 245 KB
english, 2007