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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Reflection, Scattering, and Diffraction from Surfaces - NIR reflectance method to determine moisture content in food products
Gu, Zu-Han, Kandala, C. V. K., Konda Naganathan, G., Hanssen, Leonard M., Subbiah, J.Volume:
7065
Year:
2008
Language:
english
DOI:
10.1117/12.793267
File:
PDF, 313 KB
english, 2008