SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Two- and Three-Dimensional Methods for Inspection and Metrology VI - Evaluation of large conic concave surfaces using a coordinate measurement machine and genetic algorithms
Santiago-Alvarado, A., Huang, Peisen S., Yoshizawa, Toru, Vázquez-Montiel, S., González-García, J., Harding, Kevin G., López-López, A.Volume:
7066
Year:
2008
Language:
english
DOI:
10.1117/12.795725
File:
PDF, 588 KB
english, 2008