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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Development of oral cavity inspecting system
Zhang, Hongxia, Ye, Shenghua, Zhang, Guangjun, Wu, Di, Jia, Dagong, Ni, Jun, Zhang, YimoVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.837519
File:
PDF, 2.26 MB
english, 2009